The accurate characterization of thin‐film light emitting diodes (LEDs)—including organic light emitting diodes (OLEDs), perovskite LEDs, and quantum dot LEDs—is crucial to the understanding of the factors that influence their efficiency and thus to the fabrication of LEDs with improved performance and stability. In addition, detailed information about the angular characteristics of LED emission is useful to assess the suitability of individual architectures, e.g., for display applications.

In our latest paper in Advanced Optical Matterials, we describe the implementation of a goniometer‐based measurement system and corresponding protocol that allow to accurately determine the current–voltage–luminance characteristics, external quantum efficiency, and luminous efficacy of OLEDs and other emerging thin‐film LEDs. The system allows recording of angle‐resolved electroluminescence spectra and accurate efficiency measurements for devices with both Lambertian and non‐Lambertian emission characteristics. A detailed description of the setup and a protocol for assembling and aligning the required hardware are provided. Drawings of all custom parts and the open‐source Python software required to perform the measurement and to analyze the data are included.